In this work, we demonstrate the concept of a new type of mass sensor detector. The detector is designed to act as a switch that is triggered if the measured mass exceeds a threshold value. The basic idea of the proposed switch is based on utilizing the escape phenomenon that the nonlinear electrostatic force introduces to the dynamics of a capacitive microcantilever. The detector is excited electrostatically with a frequency near the primary or the sub-harmonics (twice the natural frequency) resonances a way from the instability frequency band (escape phenomenon). By absorbing a threshold mass of a target material, the natural frequency of the cantilever will change in a way that it starts to oscillate in the unstable zone and hence hits the substrate. This action could be utilized to activate, for example, an alarming system indicating that the measured material has exceeded the allowable threshold mass (concentration) value.
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ASME 2008 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference
August 3–6, 2008
Brooklyn, New York, USA
Conference Sponsors:
- Design Engineering Division and Computers in Engineering Division
ISBN:
978-0-7918-4328-4
PROCEEDINGS PAPER
On the Utilization of the Escape Phenomenon to Realize New Mass Detectors
Fadi M. Alsaleem,
Fadi M. Alsaleem
State University of New York - Binghamton, Binghamton, NY
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Mohammad I. Younis
Mohammad I. Younis
State University of New York - Binghamton, Binghamton, NY
Search for other works by this author on:
Fadi M. Alsaleem
State University of New York - Binghamton, Binghamton, NY
Mohammad I. Younis
State University of New York - Binghamton, Binghamton, NY
Paper No:
DETC2008-50122, pp. 605-611; 7 pages
Published Online:
July 13, 2009
Citation
Alsaleem, FM, & Younis, MI. "On the Utilization of the Escape Phenomenon to Realize New Mass Detectors." Proceedings of the ASME 2008 International Design Engineering Technical Conferences and Computers and Information in Engineering Conference. Volume 4: 20th International Conference on Design Theory and Methodology; Second International Conference on Micro- and Nanosystems. Brooklyn, New York, USA. August 3–6, 2008. pp. 605-611. ASME. https://doi.org/10.1115/DETC2008-50122
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