The languages and logical formalisms developed by information scientists and logicians concentrate on the theory of languages and logical theorem proving. These languages, when used by domain experts to represent their domain of discourse, most often have issues related to the level of expressiveness and need specific extensions. In this paper, we first analyze the requirements for the development of structured knowledge representation models for manufacturing products. We then explore how these requirements can be satisfied through the levels of logical formalisms and expressivity of a structured knowledge representation model. We report our analysis of description logic (DL) and domain-specific rules with respect to the requirements by giving an example of a product ontology developed with ontology web language-description logic (OWL) and augmented with semantic web rule language (SWRL) rules. Clearly, increasing the expressivity of a product ontology also improves that of domain-specific rules, but there exits the usual tradeoff between the expressivity of languages and the complexity of their reasoning tasks. We present a case study of an electromechanical product to validate the analysis and further show how the OWL-DL reasoner together with the rule engine can enable reasoning about the product ontology. We finally discuss the open issues such as capabilities and limitations related to the usage of DL, OWL, and SWRL for product modeling.
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e-mail: xenia.fiorentini@nist.gov
e-mail: rachuri.sudarsan@nist.gov
e-mail: hyowon.suh@nist.gov
e-mail: lee.jaehyun@nist.gov
e-mail: ram.sriram@nist.gov
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June 2010
Research Papers
An Analysis of Description Logic Augmented with Domain Rules for the Development of Product Models
Xenia Fiorentini,
Xenia Fiorentini
Manufacturing Systems Integration Division, Design Process Group,
e-mail: xenia.fiorentini@nist.gov
National Institute of Standards and Technology
, Gaithersburg, MD 20899
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Sudarsan Rachuri,
Sudarsan Rachuri
Manufacturing Systems Integration Division, Design Process Group,
e-mail: rachuri.sudarsan@nist.gov
National Institute of Standards and Technology
, Gaithersburg, MD 20899
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Hyowon Suh,
Hyowon Suh
Manufacturing Systems Integration Division, Design Process Group,
e-mail: hyowon.suh@nist.gov
National Institute of Standards and Technology
, Gaithersburg, MD 20899
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Jaehyun Lee,
Jaehyun Lee
Manufacturing Systems Integration Division, Design Process Group,
e-mail: lee.jaehyun@nist.gov
National Institute of Standards and Technology
, Gaithersburg, MD 20899
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Ram D. Sriram
Ram D. Sriram
Manufacturing Systems Integration Division, Design Process Group,
e-mail: ram.sriram@nist.gov
National Institute of Standards and Technology
, Gaithersburg, MD 20899
Search for other works by this author on:
Xenia Fiorentini
Manufacturing Systems Integration Division, Design Process Group,
National Institute of Standards and Technology
, Gaithersburg, MD 20899e-mail: xenia.fiorentini@nist.gov
Sudarsan Rachuri
Manufacturing Systems Integration Division, Design Process Group,
National Institute of Standards and Technology
, Gaithersburg, MD 20899e-mail: rachuri.sudarsan@nist.gov
Hyowon Suh
Manufacturing Systems Integration Division, Design Process Group,
National Institute of Standards and Technology
, Gaithersburg, MD 20899e-mail: hyowon.suh@nist.gov
Jaehyun Lee
Manufacturing Systems Integration Division, Design Process Group,
National Institute of Standards and Technology
, Gaithersburg, MD 20899e-mail: lee.jaehyun@nist.gov
Ram D. Sriram
Manufacturing Systems Integration Division, Design Process Group,
National Institute of Standards and Technology
, Gaithersburg, MD 20899e-mail: ram.sriram@nist.gov
J. Comput. Inf. Sci. Eng. Jun 2010, 10(2): 021008 (13 pages)
Published Online: June 8, 2010
Article history
Received:
November 5, 2008
Revised:
February 8, 2010
Online:
June 8, 2010
Published:
June 8, 2010
Citation
Fiorentini, X., Rachuri, S., Suh, H., Lee, J., and Sriram, R. D. (June 8, 2010). "An Analysis of Description Logic Augmented with Domain Rules for the Development of Product Models." ASME. J. Comput. Inf. Sci. Eng. June 2010; 10(2): 021008. https://doi.org/10.1115/1.3385794
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