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Issues
June 2000
ISSN 1043-7398
EISSN 1528-9044
In this Issue
Technical Papers
Measurement of Dynamic Warpage During Thermal Cycling of Dielectric Coated SS Substrates for Large Area MCM-D Packaging
J. Electron. Packag. June 2000, 122(2): 77–85.
doi: https://doi.org/10.1115/1.483138
Topics:
Temperature
,
Warping
,
Stainless steel
A Study on Warpage of Flexible SS Substrates for Large Area MCM-D Packaging
J. Electron. Packag. June 2000, 122(2): 86–91.
doi: https://doi.org/10.1115/1.483152
Topics:
Warping
,
Coating processes
,
Packaging
,
Temperature
,
Shades and shadows
,
Stainless steel
Thermal Management Enhancement for GaAs Devices Using CVD Diamond Heat Spreaders in a Plastic Package Environment
J. Electron. Packag. June 2000, 122(2): 92–97.
doi: https://doi.org/10.1115/1.483139
Topics:
Gallium arsenide
,
Synthetic diamonds
,
Thermal management
,
Flat heat pipes
,
Packaging
Thermal Management Strategies for Embedded Electronic Components of Wearable Computers
J. Electron. Packag. June 2000, 122(2): 98–106.
doi: https://doi.org/10.1115/1.483140
Topics:
Computer simulation
,
Computers
,
Design
,
Electronics
,
Flat heat pipes
,
Heat
,
Polymer composites
,
Temperature
,
Thermal conductivity
,
Thermal management
A Numerical Study of the Thermal Performance of a Tape Ball Grid Array (TBGA) Package
J. Electron. Packag. June 2000, 122(2): 107–114.
doi: https://doi.org/10.1115/1.483141
Topics:
Ball-Grid-Array packaging
,
Heat sinks
,
Heat transfer
,
Junctions
,
Modeling
,
Natural convection
,
Radiation (Physics)
,
Solders
,
Temperature
,
Thermal conductivity
Thermal Placement Design for MCM Applications
J. Electron. Packag. June 2000, 122(2): 115–120.
doi: https://doi.org/10.1115/1.483142
Role of Out-of-Plane Coefficient of Thermal Expansion in Electronic Packaging Modeling
J. Electron. Packag. June 2000, 122(2): 121–127.
doi: https://doi.org/10.1115/1.483143
Topics:
Stress
,
Thermal expansion
,
Deformation
,
Electronic packaging
,
Plane strain
,
Modeling
Sodium Silicate Based Thermal Interface Material for High Thermal Contact Conductance
J. Electron. Packag. June 2000, 122(2): 128–131.
doi: https://doi.org/10.1115/1.483144
Topics:
Contact resistance
,
Particulate matter
,
Silicones
,
Sodium
,
Thermal conductivity
,
Boron
,
Water
,
Copper
,
Fillers (Materials)
,
Solders
Impinging Jet Boiling of a Fluorinert Liquid on a Foil Heater Array
J. Electron. Packag. June 2000, 122(2): 132–137.
doi: https://doi.org/10.1115/1.483145
Topics:
Boiling
,
Coolants
,
Critical heat flux
,
Flow (Dynamics)
,
Forced convection
,
Heat transfer
,
Strips
,
Subcooling
,
Temperature
,
Nozzles
Computational Modeling and Validation of the Encapsulation of Plastic Packages by Transfer Molding
J. Electron. Packag. June 2000, 122(2): 138–146.
doi: https://doi.org/10.1115/1.483146
Topics:
Cavities
,
Flow (Dynamics)
,
Molding
,
Pressure
,
Simulation
,
Temperature
,
Transfer molding
,
Viscosity
,
Computer simulation
,
Computer software
A Technique to Measure Interfacial Toughness Over a Range of Phase Angles
J. Electron. Packag. June 2000, 122(2): 147–151.
doi: https://doi.org/10.1115/1.483147
Topics:
Adhesives
,
Fracture (Materials)
,
Fracture mechanics
,
Fracture toughness
,
Stress
,
Finite element analysis
,
Testing
Multiobjective Optimal Placement of Convectively and Conductively Cooled Electronic Components on Printed Wiring Boards
J. Electron. Packag. June 2000, 122(2): 152–159.
doi: https://doi.org/10.1115/1.483148
Topics:
Electrical wires
,
Electronic components
,
Failure
,
Genetic algorithms
,
Heat
,
Heat transfer
,
Optimization
,
Pareto optimization
,
Printed circuit boards
,
Design
Flow Analysis in a Chip Cavity During Semiconductor Encapsulation
J. Electron. Packag. June 2000, 122(2): 160–167.
doi: https://doi.org/10.1115/1.483149
Topics:
Cavities
,
Cross-flow
,
Flow (Dynamics)
,
Molding
,
Epoxy adhesives
,
Epoxy resins
,
Semiconductors (Materials)
A Novel High Performance Die Attach for Ceramic Packages
J. Electron. Packag. June 2000, 122(2): 168–171.
doi: https://doi.org/10.1115/1.483150
Topics:
Bonding
,
Ceramics
,
Cycles
,
Shear strength
,
Solidification
,
Temperature
Nondestructive Evaluation of Ceramic Substrate With Embedded Passive Components by SAM
J. Electron. Packag. June 2000, 122(2): 172–177.
doi: https://doi.org/10.1115/1.483151
Topics:
Acoustics
,
Capacitors
,
Ceramics
,
Delamination
,
Nondestructive evaluation
,
Testing
,
Microscopy
,
Thermal shock
,
Reliability
,
Failure analysis
Book Review
Handbook of Electronic Package Design
J. Electron. Packag. June 2000, 122(2): 178–179.
doi: https://doi.org/10.1115/1.483153
Topics:
Design
,
Electronic packages
,
Thermal management
,
Printed circuit boards
,
Packaging
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