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Issues
March 2014
ISSN 1043-7398
EISSN 1528-9044
In this Issue
Research Papers
Analytical Solutions and a Numerical Approach for Diffusion-Induced Stresses in Intermetallic Compound Layers of Solder Joints
J. Electron. Packag. March 2014, 136(1): 011001.
doi: https://doi.org/10.1115/1.4025863
Topics:
Diffusion (Physics)
,
Stress
,
Tin
,
Atoms
,
Solders
,
Solder joints
Performance of Hybrid Fin Heat Sinks for Thermal Control of Light Emitting Diode Lighting Modules
J. Electron. Packag. March 2014, 136(1): 011002.
doi: https://doi.org/10.1115/1.4025673
Topics:
Forced convection
,
Heat sinks
,
Light-emitting diodes
,
Natural convection
,
Temperature
,
Heat
Comparison of Ball Pull Strength Among Various Sn-Cu-Ni Solder Joints With Different Pad Surface Finishes
J. Electron. Packag. March 2014, 136(1): 011003.
doi: https://doi.org/10.1115/1.4025915
Topics:
Finishes
,
Solder joints
,
Solders
,
Tin
,
Temperature
,
Inspection
A Compact Modeling Approach to Enhance Collaborative Design of Thermal-Fluid Systems
J. Electron. Packag. March 2014, 136(1): 011004.
doi: https://doi.org/10.1115/1.4026051
Topics:
Boundary-value problems
,
Design
,
Modeling
,
Thermofluids
,
Computational fluid dynamics
,
Temperature
Heterogeneous Void Nucleation Study in Flip Chip Assembly Process Using No-Flow Underfill
J. Electron. Packag. March 2014, 136(1): 011005.
doi: https://doi.org/10.1115/1.4026164
Topics:
Flow (Dynamics)
,
Nucleation (Physics)
,
Temperature
,
Manufacturing
,
Solders
The Strength of High-Temperature Ag–In Joints Produced Between Copper by Fluxless Low-Temperature Processes
J. Electron. Packag. March 2014, 136(1): 011006.
doi: https://doi.org/10.1115/1.4026171
Topics:
Alloys
,
Bonding
,
Copper
,
Design
,
High temperature
,
Low temperature
,
Shear (Mechanics)
,
Silver
,
Solid solutions
,
Temperature
A New Accurate Closed-Form Analytical Solution for Junction Temperature of High-Powered Devices
J. Electron. Packag. March 2014, 136(1): 011007.
doi: https://doi.org/10.1115/1.4026352
Investigation of Multiple Miniature Axial Fan Cooling Solutions and Thermal Modeling Approaches
J. Electron. Packag. March 2014, 136(1): 011008.
doi: https://doi.org/10.1115/1.4026351
Topics:
Cooling
,
Design
,
Fans
,
Flow (Dynamics)
,
Heat sinks
,
Heat transfer
,
Thermal resistance
,
Computer simulation
,
Modeling
,
Air flow
Thermally Conductive and Highly Electrically Resistive Grease Through Homogeneously Dispersing Liquid Metal Droplets Inside Methyl Silicone Oil
J. Electron. Packag. March 2014, 136(1): 011009.
doi: https://doi.org/10.1115/1.4026414
Topics:
Drops
,
Liquid metals
,
Silicones
,
Thermal conductivity
Optimization of a Hybrid Double-Side Jet Impingement Cooling System for High-Power Light Emitting Diodes
J. Electron. Packag. March 2014, 136(1): 011010.
doi: https://doi.org/10.1115/1.4026536
Topics:
Cooling
,
Cooling systems
,
Design
,
Impingement cooling
,
Light-emitting diodes
,
Optimization
,
Temperature
,
Numerical analysis
,
Flow (Dynamics)
,
Pressure
Room Level Modeling of Air Flow in a Contained Data Center Aisle
J. Electron. Packag. March 2014, 136(1): 011011.
doi: https://doi.org/10.1115/1.4026540
Topics:
Air entrainment
,
Air flow
,
Containment
,
Data centers
,
Flow (Dynamics)
,
Modeling
,
Temperature
,
Tiles
,
Momentum
,
Resolution (Optics)
Thermal Resistance Analysis of Sn-Bi Solder Paste Used as Thermal Interface Material for Power Electronics Applications
J. Electron. Packag. March 2014, 136(1): 011012.
doi: https://doi.org/10.1115/1.4026616
Topics:
Electronics
,
Solders
,
Thermal resistance
,
Tin
,
Plates (structures)
,
Lasers
Hygrothermal Behavior of Advanced Polymers Above Water Boiling Temperatures
J. Electron. Packag. March 2014, 136(1): 011013.
doi: https://doi.org/10.1115/1.4026626
Topics:
Boiling
,
Polymers
,
Temperature
,
Water
,
Weight (Mass)
,
Glass transition
,
Absorption
Intermittent Failures in Hardware and Software
J. Electron. Packag. March 2014, 136(1): 011014.
doi: https://doi.org/10.1115/1.4026639
Topics:
Computer software
,
Failure
,
Hardware
Technology Review
Three-Dimensional and 2.5 Dimensional Interconnection Technology: State of the Art
J. Electron. Packag. March 2014, 136(1): 014001.
doi: https://doi.org/10.1115/1.4026615
Topics:
Bonding
,
Manufacturing
,
Semiconductor wafers
,
Solders
,
Packaging
,
Low temperature
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Sequential Versus Concurrent Effects in Combined Stress Solder Joint Reliability
J. Electron. Packag
Anand Model Constants of Sn-Ag-Cu Solders: What Do They Actually Mean?
J. Electron. Packag