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J. Eng. Mater. Technol. January 2010, 132(1): 011001. doi: https://doi.org/10.1115/1.3184027
J. Eng. Mater. Technol. January 2010, 132(1): 011002. doi: https://doi.org/10.1115/1.3184029
J. Eng. Mater. Technol. January 2010, 132(1): 011003. doi: https://doi.org/10.1115/1.3184030
J. Eng. Mater. Technol. January 2010, 132(1): 011004. doi: https://doi.org/10.1115/1.3184031
J. Eng. Mater. Technol. January 2010, 132(1): 011005. doi: https://doi.org/10.1115/1.3184032
J. Eng. Mater. Technol. January 2010, 132(1): 011006. doi: https://doi.org/10.1115/1.3184033
J. Eng. Mater. Technol. January 2010, 132(1): 011007. doi: https://doi.org/10.1115/1.3184035
J. Eng. Mater. Technol. January 2010, 132(1): 011008. doi: https://doi.org/10.1115/1.3184036
J. Eng. Mater. Technol. January 2010, 132(1): 011009. doi: https://doi.org/10.1115/1.3184037
J. Eng. Mater. Technol. January 2010, 132(1): 011010. doi: https://doi.org/10.1115/1.3184038
J. Eng. Mater. Technol. January 2010, 132(1): 011011. doi: https://doi.org/10.1115/1.3184082
J. Eng. Mater. Technol. January 2010, 132(1): 011012. doi: https://doi.org/10.1115/1.3184083
J. Eng. Mater. Technol. January 2010, 132(1): 011013. doi: https://doi.org/10.1115/1.3184084
J. Eng. Mater. Technol. January 2010, 132(1): 011014. doi: https://doi.org/10.1115/1.4000217
J. Eng. Mater. Technol. January 2010, 132(1): 011015. doi: https://doi.org/10.1115/1.4000218
J. Eng. Mater. Technol. January 2010, 132(1): 011016. doi: https://doi.org/10.1115/1.4000220
J. Eng. Mater. Technol. January 2010, 132(1): 011017. doi: https://doi.org/10.1115/1.2931155
J. Eng. Mater. Technol. January 2010, 132(1): 011018. doi: https://doi.org/10.1115/1.4000302
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