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K.-C. Liao
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Journal Articles

Experimental and Numerical Investigations of Intermittence for Electronic Connectors Subjected to Mechanical Shocks

T.-C. Huang, K.-C. Liao
Journal: Journal of Electronic Packaging
Publisher: ASME
Article Type: Research-Article
J. Electron. Packag. March 2023, 145(1): 011206.
Paper No: EP-22-1010
https://doi.org/10.1115/1.4054822
Published Online: August 3, 2022
View Article titled, Experimental and Numerical Investigations of Intermittence for Electronic Connectors Subjected to Mechanical Shocks
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Topics: Shock (Mechanics), Contact resistance, Displacement
Journal Articles

Multiphysics Analysis for Temperature Rise of Electronic Connectors Using a Multiscale Model

K.-C. Liao, H.-L. Lu
Journal: Journal of Electronic Packaging
Publisher: ASME
Article Type: Research-Article
J. Electron. Packag. September 2015, 137(3): 031012.
Paper No: EP-15-1034
https://doi.org/10.1115/1.4030803
Published Online: September 1, 2015
View Article titled, Multiphysics Analysis for Temperature Rise of Electronic Connectors Using a Multiscale Model
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Topics: Computer simulation, Molten salt reactors, Temperature, Temperature distribution
Proceedings Papers

Relaxation Investigation for Terminals of Electronic Connectors Under Thermal Shock Test

K.-C. Liao, K.-H. Lin
Proc. ASME. IMECE2007, Volume 5: Electronics and Photonics, 391-395, November 11–15, 2007
Publisher: American Society of Mechanical Engineers
Paper No: IMECE2007-43340
https://doi.org/10.1115/IMECE2007-43340
View Paper titled, Relaxation Investigation for Terminals of Electronic Connectors Under Thermal Shock Test
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Topics: Relaxation (Physics), Thermal shock, Electrical resistance, Creep, Cycles, Temperature, Bronze, Finite element analysis, Numerical analysis, Phosphors
Proceedings Papers

Application of Damage Models to Reliability Investigations for Input/Output Electronic Connectors

C.-C. Chang, K.-C. Liao
Proc. ASME. IMECE2006, Engineering Technology Management: Engineering Business Management, Safety Engineering and Risk Analysis, Technology and Society, 3-8, November 5–10, 2006
Publisher: American Society of Mechanical Engineers
Paper No: IMECE2006-13017
https://doi.org/10.1115/IMECE2006-13017
View Paper titled, Application of Damage Models to Reliability Investigations for Input/Output Electronic Connectors
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Topics: Damage, Reliability, Cycles, Design, Electrical resistance, Signals